The FIB is a highly effective piece of technology that can accelerate the specimen preparation processes for use in a SEM or a TEM through the application of its micro-machining, sectioning, and ...

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

James Chen, CMT is an expert trader, investment adviser, and global market strategist. Doretha Clemons, Ph.D., MBA, PMP, has been a corporate IT executive and professor for 34 years. She is an adjunct ...